Ernst, F., Michal, G., Oba, F., Liu, L., Blush, J., & Heuer, A. H.(2006).Gas-Phase Surface Alloying under “Kinetic Control,” A Novel Approach to Improving the Surface Properties of Titanium Alloys.International Journal of Materials Research,97, 597-606.
Gentil, J., Ernst, F., Michal, G., & Heuer, A. H.(2006).The Effect of Colossal Carbon Supersaturation on Stainless Steels of the Type PH13-8Mo and AL6XN.AIST - TMS.
Ernst, F., Michal, G., Kahn, H., & Heuer, A. H.(2006).Paraequilibrium Surface Alloying with Interstitial Solutes: A New Concept for Improving the Performance of Medical Devices.ASM International.
French, R. H., Sewell, H. H., Yang, S. H., Peng, S. H., McCafferty, D. H., Qiu, W. H., Wheland, R. H., Lemon, M. H., Markoya, L. H., & Crawford, M. H.(2005).Imaging of 32-nm 1:1 lines and spaces using 193-nm immersion interference lithography with second-generation immersion fluids to achieve a numerical aperture of 1.5 and a k[sub 1] of 0.25.Journal of Microlithography, Microfabrication, and Microsystems,4, 031103.
Peng, S., French, R. H., Qiu, W. H., Wheland, R. H., Yang, S. H., Lemon, M. H., & Crawford, M. H.(2005).Second generation fluids for 193 nm immersion lithography.Proceedings of SPIE.
Mo, S., Ching, W., & French, R. H.(2005).Electronic Structure of a Near Σ11 a-axis Tilt Grain Boundary in {α-A12O3}.Journal of the American Ceramic Society,79, 627–633.
French, R. H.(2005).{Kramers–Kronig} transform for the surface energy loss function.Journal of Electron Spectroscopy and Related Phenomena,142, 97–103.
French, R. H., Müllejans, H. H., & Jones, D. H.(2005).Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron {Energy-Loss} Spectroscopies.Journal of the American Ceramic Society,81, 2549–2557.
Thiele, E., & French, R. H.(2005).{Light-Scattering} Properties of Representative, Morphological Rutile Titania Particles Studied Using a {Finite-Element} Method.Journal of the American Ceramic Society,81, 469–479.
Oba, F., Ernst, F., Yu, Y., Liu, R., Kothari, H., & Switzer, J.(2005).Epitaxial Growth of Cuprous Oxide Electrodeposited onto Semiconductor and Metal Substrates (invited “feature article”).Journal of the American Ceramic Society,88, 253-270.
Liu, L., Ernst, F., Michal, G., & Heuer, A. H.(2005).Surface Hardening of Ti Alloys by Gas-Phase Nitridation: Kinetic Control of the Nitrogen Surface Activity.Metallurgical and Materials Transactions,36, 2429-2434.
Liu, R., Kulp, E., Oba, F., Bohannan, E., Ernst, F., & Switzer, J.(2005).Epitaxial Electrodeposition of High-Aspect-Ratio Cu2O(110) Nanostructures on InP(111).Chemistry of Materials,17, 725-729.
Smith, J., French, R. H., Duscher, G. H., & Bonnell, D. H.(2004).Consequence of {Nanometer-Scale} Property Variations to Macroscopic Properties of {CrOCN} Thin Films.Journal of the American Ceramic Society,84, 2873–2881.
French, R. H.(2004).Origins and Applications of London Dispersion Forces and Hamaker Constants in Ceramics.Journal of the American Ceramic Society,83, 2117–2146.
Tan, G., Lemon, M., & French, R. H.(2004).Optical Properties and London Dispersion Forces of Amorphous Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry.Journal of the American Ceramic Society,86, 1885–1892.
Synowicki, R., Pribil, G., Cooney, G., Herzinger, C., Green, S., French, R. H., Yang, S. H., Burnett, J. H., & Kaplan, S. H.(2004).Fluid refractive index measurements using rough surface and prism minimum deviation techniques.Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures,22, 3450.
Van Benthem, K., Tan, G., Denoyer, L., French, R. H., & Ruhle, M. H.(2004).Local Optical Properties, Electron Densities, and London Dispersion Energies of Atomically Structured Grain Boundaries.Physical Review Letters,93
Du, K., Ernst, F., Ikuhara, Y., & Pirouz, P.(2004).Preferred Intercrystalline Orientation Relationships and the Near Coincidence of Reciprocal Lattice Points..
Oba, F., Liu, R., Yu, Y., Bohannan, E., Ernst, F., & Switzer, J.(2004).TEM Studies of Cu2O–Si and Cu2O–InP Interfaces Made by Epitaxial Electrodeposition..
Lee, K., Jockusch, S., Turro, N., French, R. H., Wheland, R. H., Lemon, M. H., Braun, A. H., Widerschpan, T. H., & Zimmerman, P. H.(2004).157-nm pellicles for photolithography: mechanistic investigation of the {deep-UV} photolysis of fluorocarbons.Proceedings of SPIE.
French, R. H., Yang, S. H., Lemon, M. H., Synowicki, R. H., Pribil, G. H., Cooney, G. H., Herzinger, C. H., Green, S. H., Burnett, J. H., & Kaplan, S. H.(2004).Immersion fluid refractive indices using prism minimum deviation techniques.Proceedings of SPIE.
Lyutovich, K., Oehme, M., & Ernst, F.(2004).Growth of Ultra-Thin and Highly Relaxed SiGe Layers Under In-Situ Introduction of Point Defects.European Physical Journal of Applied Physics,27, 341.
