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Swagelok Center for Surface Analysis of Materials

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Swagelok Center for Surface Analysis of Materials

Swagelok Center for Surface Analysis of Materials News

Jul. 9, 2021

Engineering’s Jennifer Carter invited to US Frontiers of Engineering Symposium

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Swagelok Center for Surface Analysis of Materials

  • About
    • Vision and Mission
    • Staff
  • Image Analysis
    • Electron Microscopy
      • Scanning Electron Microscopy
      • Transmission Electron Microscopy
    • Optical Microscopy
    • Atomic Force Microscopy (AFM) Veeco Dimension 3100
  • Chemical Analysis
    • PHI Versaprobe 5000 Scanning X-Ray Photoelectron Spectrometer (XPS)
    • PHI TRIFT V nano TOF Time-of-Flight Secondary Ion Mass Spectrometer
    • Bruker Tracer 5g Portable X-Ray Fluorescence Spectrometer (pXRF)
  • Structure and Properties Analysis
    • X-Ray Diffraction
    • Nanoindentation
    • Specimen Preparation
  • User Information
    • User Publications
    • Visit Us

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