Ernst, F.(1997).Interface Dislocations Forming in GeSi Layers During Epitaxy on {111} Si Substrates at High Temperatures.Materials Science and Engineering A,233, 126–138.
Klement, U., Horst, D., & Ernst, F.(1997).Microstructure of Thin Film Photoconductors and its Correlation with Optical and Electronic Properties.,452, 925–930.
French, R. H., & Xu, Y. H.(1996).First-principles investigation of the optical properties of crystalline poly(di-n-hexylsilane).Physical Review B,54(19),13546-13550.
French, R. H., & Xu, Y. H.(1996).Critical point analysis of the interband transition strength of electrons.Journal of Physics D: Applied Physics,29(7),1740-1750.
French, R. H., & Müllejans, H. H.(1996).Interband electronic structure of a near- grain boundary in -alumina determined by spatially resolved valence electron energy-loss spectroscopy.Journal of Physics D: Applied Physics,29(7),1751-1760.
French, R. H., & Mo, S. H.(1996).Optical properties of a near-Sigma-11 a axis tilt grain boundary in alpha-Al2O3.Journal of Physics D: Applied Physics,29(7),1761-1766.
French, R. H., Ackler, H. H., & Chiang, Y. H.(1996).Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties.Journal of Colloid and Interface Science,179(2),460-469.
Nadarzinski, K., & Ernst, F.(1996).The Atomistic Structure of a =3, (111) Grain Boundary in NiAl, Studied by Quantitative High-Resolution Transmission Electron Microscopy.Philosophical Magazine A,74, 641–664.
Dehm, G., Nadarzinski, K., Ernst, F., & Rühle, M.(1996).Quantification of Irradiation Damage Generated During HRTEM with 1250keV Electrons.Ultramicroscopy,63, 49–55.
Ernst, F., Finnis, M., Gust, W., Koch, A., Schmidt, C., & Straumal, B.(1996).Structure and Energy of Twin Boundaries in Copper.Zeitschrift für Metallkunde,87, 911–922.
Ernst, F., Hofmann, D., Nadarzinski, K., Stemmer, S., & Streiffer, S.(1996).Quantitative High-Resolution Electron Microscopy of Interfaces.Transtec Publications Ltd..
Ernst, F., & Rühle, M.(1996).Structure of Twin Boundaries in Copper, Studied by Quantitative High-Resolution Transmission Electron Microscopy.The Japan Institute of Metals.
French, R. H.(1995).Interfacial Electronic Structure and Full Spectral Hamaker Constants of {Si3N4} Intergranular Films from {VUV} and {SR-VEEL} Spectroscopy.Materials Research Society.
French, R. H., Wilson, S. H., Naqvi, S. H., McNeil, J. H., Marchman, H. H., Johs, B. H., & Kalk, F. H.(1995).Metrology of etched quartz and chrome embedded phase shift gratings using scatterometry.SPIE,2439
French, R. H.(1995). Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths.Solid State Ionics,75, 13-33.
