Kienzle, O., Ernst, F., & Mobus, G.(1998).Reliability of Atom Column Positions in a Ternary System Determined by Quantitative High-Resolution Transmission Electron Microscopy.Journal of Microscopy,190, 144–158.
French, R. H., & Thiele, E. H.(1997).Computational Modeling of {TiO2} Particle Optics Using a Finite Element Method.Proceedings of the Paint Research Association.
French, R. H., & Müllejans, H. H.(1997).Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure.Proceedings of the Microscopy Society of America.
French, R. H., Johnson, R. H., & Thiele, E. H.(1997).Light-scattering efficiency of white pigments: an analysis of model core - shell pigments vs. optimized rutile {TiO2}.{TAPPI} Journal,80, 233-239.
Baither, D., Messerschmidt, U., Baufeld, B., Bartsch, M., & Ernst, F.(1997).In-situ Straining Experiments in HVEM to Study Deformation of Zirconia and NiAl..
French, R. H., Francis Carcia, P. H., & Jones, D. H.(1997).Optical superlattices—a strategy for designing phase-shift masks for photolithography at 248 and 193 nm: Application to {AlN/CrN}.Applied Physics Letters,70(18),2371-2373.
Kienzle, O., Exner, M., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.,466, 95-106.
Ernst, F.(1997).Interface Dislocations Forming in GeSi Layers During Epitaxy on {111} Si Substrates at High Temperatures.Materials Science and Engineering A,233, 126–138.
Klement, U., Horst, D., & Ernst, F.(1997).Microstructure of Thin Film Photoconductors and its Correlation with Optical and Electronic Properties.,452, 925–930.
Kienzle, O., & Ernst, F.(1997).Effect of Shear Stress on the Atomistic Structure of a Grain Boundary in Strontium Titanate.Journal of the American Ceramic Society,80, 1639–1644.
Schweinfest, R., Gemming, T., Kopold, P., Ernst, F., & Rühle, M.(1997).Measurement of Tridentate Astigmatism of a Conventional HRTEM and a high-vacuum HRTEM.European Journal of Cell Biology,74, 78-78.
Ernst, F., & Rühle, M.(1997).Present Developments in High-Resolution Transmission Electron Microscopy.Current Opinion in Solid State & Material Science,2, 469-476.
Nadarzinski, K., Kienzle, O., & Ernst, F.(1997).Analysis of Interface Structures by Quantitative High-Resolution Transmission Electron Microscopy.San Francisco Press Inc..
